Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1577390
Preview
| Coordinates | 1577390.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Tetrakis(4-(methylthio)phenyl)silane |
|---|---|
| Formula | C28 H28 S4 Si |
| Calculated formula | C28 H28 S4 Si |
| Title of publication | Enhanced electronic coupling in tetraaryl molecular junctions with osmium(IV) centers |
| Authors of publication | Zagami, Luana; Sharma, Mukund; Fraire, Andrew; Avedian, Cynthia; Olivar, Clarissa; Czyszczon-Burton, Thomas M.; Prana, Jazmine; Yergeshbayeva, Sandugash; Camarasa-Gómez, María; Hernangómez-Pérez, Daniel; Inkpen, Michael Stephen |
| Journal of publication | Chemical Science |
| Year of publication | 2026 |
| a | 13.3502 ± 0.0002 Å |
| b | 13.3502 ± 0.0002 Å |
| c | 7.3339 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1307.11 ± 0.05 Å3 |
| Cell temperature | 100 ± 0.3 K |
| Ambient diffraction temperature | 100 ± 0.3 K |
| Number of distinct elements | 4 |
| Space group number | 82 |
| Hermann-Mauguin space group symbol | I -4 |
| Hall space group symbol | I -4 |
| Residual factor for all reflections | 0.027 |
| Residual factor for significantly intense reflections | 0.0262 |
| Weighted residual factors for significantly intense reflections | 0.0684 |
| Weighted residual factors for all reflections included in the refinement | 0.0692 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
Version history
Version history is temporarily not available due to server issues.
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.