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Information card for entry 2005251
Preview
| Coordinates | 2005251.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C14 H30 N2 S4 Zn2 |
|---|---|
| Calculated formula | C14 H30 N2 S4 Zn2 |
| SMILES | C(C)[Zn]12[S]=C(N(CC)CC)[S]1[Zn]1(CC)[S]2C(N(CC)CC)=[S]1 |
| Title of publication | Bis(μ-diethyldithiocarbamato)-1κ<i>S</i>,1:2κ^2^<i>S</i>';2κ<i>S</i>,1:2κ^2^<i>S</i>'-bis(ethylzinc) |
| Authors of publication | Malik, M. A.; O'Brien, P.; Motevalli, M. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1996 |
| Journal volume | 52 |
| Journal issue | 8 |
| Pages of publication | 1931 - 1933 |
| a | 14.605 ± 0.003 Å |
| b | 9.877 ± 0.002 Å |
| c | 7.569 ± 0.001 Å |
| α | 90° |
| β | 92.44 ± 0.02° |
| γ | 90° |
| Cell volume | 1090.9 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/a 1 |
| Hall space group symbol | -P 2yab |
| Residual factor for all reflections | 0.05 |
| Residual factor for significantly intense reflections | 0.0337 |
| Weighted residual factors for all reflections | 0.0918 |
| Weighted residual factors for significantly intense reflections | 0.0886 |
| Goodness-of-fit parameter for all reflections | 1.024 |
| Goodness-of-fit parameter for significantly intense reflections | 1.138 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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