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Information card for entry 2006307
Preview
| Coordinates | 2006307.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C26 H36 I N2 Nd Si2 |
|---|---|
| Calculated formula | C26 H36 I N2 Nd Si2 |
| SMILES | I[Nd]12345678([cH]9[cH]1[c]2([Si](C)(C)C)[cH]3[cH]49)([cH]1[cH]5[c]6([Si](C)(C)C)[cH]7[cH]18)([n]1ccccc1)[n]1ccccc1 |
| Title of publication | Iodobis(pyridine-<i>N</i>)bis(η^5^-trimethylsilylcyclopentadienyl)neodymium |
| Authors of publication | Clark, David L.; Gordon, John C.; Scott, Brian L.; Watkin, John G. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1997 |
| Journal volume | 53 |
| Journal issue | 7 |
| Pages of publication | 850 - 852 |
| a | 27.001 ± 0.002 Å |
| b | 27.001 ± 0.002 Å |
| c | 21.525 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 13590 ± 3 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 6 |
| Space group number | 167 |
| Hermann-Mauguin space group symbol | R -3 c :H |
| Hall space group symbol | -R 3 2"c |
| Residual factor for all reflections | 0.0254 |
| Residual factor for significantly intense reflections | 0.0197 |
| Weighted residual factors for all reflections | 0.043 |
| Weighted residual factors for significantly intense reflections | 0.0413 |
| Goodness-of-fit parameter for all reflections | 1.058 |
| Goodness-of-fit parameter for significantly intense reflections | 1.081 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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