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Information card for entry 2006415
Preview
| Coordinates | 2006415.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | C32 H16 Ge I2 N8 |
|---|---|
| Calculated formula | C32 H16 Ge I2 N8 |
| SMILES | c12c3ccccc3c3=Nc4n5[Ge]6(I)([n]23)(I)[n]2c(=Nc5c3c4cccc3)c3ccccc3c2N=c2n6c(=N1)c1c2cccc1 |
| Title of publication | Isostructural Complexes of Diiodo(phthalocyaninato)germanium(IV) and Diiodo(phthalocyaninato)tin(IV) |
| Authors of publication | Ejsmont, Krzysztof; Kubiak, Ryszard |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1997 |
| Journal volume | 53 |
| Journal issue | 8 |
| Pages of publication | 1051 - 1054 |
| a | 7.522 ± 0.002 Å |
| b | 8.663 ± 0.002 Å |
| c | 11.349 ± 0.002 Å |
| α | 72.61 ± 0.03° |
| β | 78.96 ± 0.03° |
| γ | 87.31 ± 0.03° |
| Cell volume | 692.6 ± 0.3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0761 |
| Residual factor for significantly intense reflections | 0.0376 |
| Weighted residual factors for all reflections | 0.0916 |
| Weighted residual factors for significantly intense reflections | 0.0827 |
| Goodness-of-fit parameter for all reflections | 1.055 |
| Goodness-of-fit parameter for significantly intense reflections | 1.165 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
Version history
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Users of the data should acknowledge the original authors of the
structural data.