Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 2007454
Preview
| Coordinates | 2007454.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | bis(p-methoxyphenyl)tellurium(IV) diiodide |
|---|---|
| Formula | C14 H14 I2 O2 Te |
| Calculated formula | C14 H14 I2 O2 Te |
| Title of publication | Two Polymorphs of Bis(4-methoxyphenyl)tellurium(IV) Diiodide |
| Authors of publication | Joan Farran; Angel Alvarez-Larena; Mario V. Capparelli; Joan F. Piniella; Gabriel Germain; Libardo Torres-Castellanos |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1998 |
| Journal volume | 54 |
| Journal issue | 7 |
| Pages of publication | 995 - 1000 |
| a | 10.334 ± 0.001 Å |
| b | 13.091 ± 0.001 Å |
| c | 14.588 ± 0.001 Å |
| α | 110.237 ± 0.007° |
| β | 100.875 ± 0.006° |
| γ | 100.272 ± 0.008° |
| Cell volume | 1753.7 ± 0.3 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.049 |
| Residual factor for significantly intense reflections | 0.0277 |
| Weighted residual factors for all reflections | 0.0725 |
| Weighted residual factors for significantly intense reflections | 0.0706 |
| Goodness-of-fit parameter for all reflections | 1.013 |
| Goodness-of-fit parameter for significantly intense reflections | 1.198 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
Version history
Version history is temporarily not available due to server issues.
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.