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Information card for entry 2008064
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| Coordinates | 2008064.cif |
|---|---|
| Structure factors | 2008064.hkl |
| Original IUCr paper | HTML |
| Chemical name | 1,1'-Diiodo-3,3'-bis(trimethylsilyl)ferrocene |
|---|---|
| Formula | C16 H24 Fe I2 Si2 |
| Calculated formula | C16 H24 Fe I2 Si2 |
| SMILES | I[c]12[Fe]3456789([cH]1[c]3([Si](C)(C)C)[cH]4[cH]25)[c]1(I)[cH]6[c]7([Si](C)(C)C)[cH]8[cH]91 |
| Title of publication | 1,1'-Diiodo-3,3'-bis(trimethylsilyl)ferrocene |
| Authors of publication | Foucher, Daniel A.; Lough, Alan J.; Park, Peter |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1999 |
| Journal volume | 55 |
| Journal issue | 1 |
| Pages of publication | 33 - 35 |
| a | 12.0436 ± 0.0009 Å |
| b | 9.187 ± 0.0005 Å |
| c | 18.7995 ± 0.001 Å |
| α | 90° |
| β | 93.128 ± 0.008° |
| γ | 90° |
| Cell volume | 2077 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.056 |
| Residual factor for significantly intense reflections | 0.038 |
| Weighted residual factors for all reflections | 0.098 |
| Weighted residual factors for significantly intense reflections | 0.092 |
| Goodness-of-fit parameter for all reflections | 0.922 |
| Goodness-of-fit parameter for significantly intense reflections | 1.021 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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