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Information card for entry 2008826
Preview
| Coordinates | 2008826.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis(N-ethyl-N-iso-propyldithiocarbamato)lead(II) |
|---|---|
| Formula | C12 H24 N2 Pb S4 |
| Calculated formula | C12 H24 N2 Pb S4 |
| SMILES | [Pb]12([S]=C(N(CC)C(C)C)S1)[S]=C(N(CC)C(C)C)S2 |
| Title of publication | Space-group revision for bis(<i>N</i>-ethyl-<i>N</i>-isopropyldithiocarbamato)lead(II) |
| Authors of publication | Ng, Seik Weng |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 1999 |
| Journal volume | 55 |
| Journal issue | 8 |
| Pages of publication | IUC9900091 |
| a | 22.478 ± 0.004 Å |
| b | 9.718 ± 0.002 Å |
| c | 8.734 ± 0.002 Å |
| α | 90° |
| β | 102.62 ± 0.03° |
| γ | 90° |
| Cell volume | 1861.8 ± 0.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.053 |
| Residual factor for significantly intense reflections | 0.032 |
| Weighted residual factors for all reflections included in the refinement | 0.084 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.069 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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