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Information card for entry 2010537
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| Coordinates | 2010537.cif |
|---|---|
| Structure factors | 2010537.hkl |
| Original IUCr paper | HTML |
| Common name | Oxovanadiumacetate |
|---|---|
| Chemical name | tetraphenylphosphonium μ~4~-nitrato-κ^4^O-cyclo- tetrakis(μ-acetato-κO:κO')tetra-μ-oxo-tetrakis[oxovanadium(V)] |
| Formula | C32 H32 N O19 P V4 |
| Calculated formula | C32 H32 N O19 P V4 |
| Title of publication | The cyclic vanadylacetate (C~24~H~20~P)[V~4~O~8~(C~2~H~3~O~2~)~4~(NO~3~)] |
| Authors of publication | Wulff-Molder, Dirk; Meisel, Manfred |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2000 |
| Journal volume | 56 |
| Journal issue | 1 |
| Pages of publication | 33 - 34 |
| a | 15.856 ± 0.002 Å |
| b | 15.856 ± 0.002 Å |
| c | 29.753 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7480.3 ± 1.8 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.064 |
| Residual factor for significantly intense reflections | 0.042 |
| Weighted residual factors for all reflections | 0.112 |
| Weighted residual factors for significantly intense reflections | 0.1 |
| Goodness-of-fit parameter for all reflections | 1.015 |
| Goodness-of-fit parameter for significantly intense reflections | 1.126 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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