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Information card for entry 2010577
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| Coordinates | 2010577.cif |
|---|---|
| Structure factors | 2010577.hkl |
| Original IUCr paper | HTML |
| Common name | Bismuth Selenide Iodide |
|---|---|
| Chemical name | Bismuth Selenide Iodide |
| Formula | Bi I Se |
| Calculated formula | Bi I Se |
| SMILES | [Bi]12[Se][Bi]34(I)[Se]1[Bi]1(I)([I]2)[Se]3[Bi]([I]4)[Se]1 |
| Title of publication | Bismuth selenide iodide |
| Authors of publication | Braun, Thomas P.; DiSalvo, Francis J. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2000 |
| Journal volume | 56 |
| Journal issue | 1 |
| Pages of publication | e1 - e2 |
| a | 8.6967 ± 0.0017 Å |
| b | 4.2205 ± 0.0008 Å |
| c | 10.574 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 388.11 ± 0.13 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.049 |
| Residual factor for significantly intense reflections | 0.047 |
| Weighted residual factors for all reflections included in the refinement | 0.123 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.198 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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