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Information card for entry 2012009
Preview
| Coordinates | 2012009.cif |
|---|---|
| Structure factors | 2012009.hkl |
| Original IUCr paper | HTML |
| Common name | Lutetium silicate |
|---|---|
| Chemical name | Dilutetium silicon pentaoxide |
| Formula | Lu2 O5 Si |
| Calculated formula | Lu2 O5 Si |
| Title of publication | Lu~2~SiO~5~ by single-crystal X-ray and neutron diffraction |
| Authors of publication | Gustafsson, T.; Klintenberg, M.; Derenzo, S. E.; Weber, M. J.; Thomas, J. O. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2001 |
| Journal volume | 57 |
| Journal issue | 6 |
| Pages of publication | 668 - 669 |
| a | 14.2774 ± 0.0007 Å |
| b | 6.6398 ± 0.0004 Å |
| c | 10.2465 ± 0.0006 Å |
| α | 90° |
| β | 122.224 ± 0.001° |
| γ | 90° |
| Cell volume | 821.74 ± 0.08 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.035 |
| Residual factor for significantly intense reflections | 0.035 |
| Weighted residual factors for all reflections | 0.078 |
| Weighted residual factors for all reflections included in the refinement | 0.078 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.91 |
| Diffraction radiation probe | neutron |
| Diffraction radiation wavelength | 1.207 Å |
| Diffraction radiation type | neutron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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