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Information card for entry 2012795
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| Coordinates | 2012795.cif |
|---|---|
| Structure factors | 2012795.hkl |
| Original IUCr paper | HTML |
| Chemical name | Gallium fluorophenylphosphonate |
|---|---|
| Formula | C6 H5 F Ga O3 P |
| Calculated formula | C6 H5 F Ga O3 P |
| Title of publication | GaFPO~3~(C~6~H~5~): a new fluorinated gallium phenylphosphonate with a layered network |
| Authors of publication | Loiseau, Thierry; Neeraj, Sharma; Cheetham, Anthony K. |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2002 |
| Journal volume | 58 |
| Journal issue | 7 |
| Pages of publication | m379 - m381 |
| a | 29.781 ± 0.0004 Å |
| b | 5.422 ± 0.0001 Å |
| c | 9.8768 ± 0.0002 Å |
| α | 90° |
| β | 96.618 ± 0.001° |
| γ | 90° |
| Cell volume | 1584.21 ± 0.05 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0515 |
| Residual factor for significantly intense reflections | 0.0421 |
| Weighted residual factors for all reflections | 0.109 |
| Weighted residual factors for all reflections included in the refinement | 0.1043 |
| Goodness-of-fit parameter for all reflections | 1.097 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.141 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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