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Information card for entry 2102159
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| Coordinates | 2102159.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | As O5 Rb Ti |
|---|---|
| Calculated formula | As O5 Rb2 Ti |
| Title of publication | Synchrotron X-ray analysis of RbTiOAsO~4~ |
| Authors of publication | Streltsov, Victor A.; Nordborg, Jenni; Albertsson, Jörgen |
| Journal of publication | Acta Crystallographica Section B |
| Year of publication | 2000 |
| Journal volume | 56 |
| Journal issue | 5 |
| Pages of publication | 785 - 792 |
| a | 13.2352 ± 0.0011 Å |
| b | 6.6666 ± 0.0007 Å |
| c | 10.7483 ± 0.0009 Å |
| α | 90 ± 0.008° |
| β | 90 ± 0.008° |
| γ | 90 ± 0.008° |
| Cell volume | 948.36 ± 0.15 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0179 |
| Residual factor for significantly intense reflections | 0.0179 |
| Weighted residual factors for all reflections | 0.0152 |
| Weighted residual factors for all reflections included in the refinement | 0.0152 |
| Goodness-of-fit parameter for all reflections | 1.22 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.22 |
| Diffraction radiation wavelength | 0.75 Å |
| Diffraction radiation type | synchrotron_xray_vertical_wiggler |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
Version history
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Users of the data should acknowledge the original authors of the
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