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Information card for entry 2103798
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| Coordinates | Coordinates are not available: file is not found. |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | bis(mu!2$-Ethane-1,2-dithiolato-S,S,S',S')-bis(ethene-1,2-dithiolato)- -technetium(iv) |
|---|---|
| Formula | C8 H12 S8 Tc2 |
| Calculated formula | C8 H12 S8 Tc2 |
| SMILES | C1S[Tc]2345(SC=1)[S]1CC[S]4[Tc]4651([S]2CC[S]34)SC=CS6 |
| Title of publication | 22 Space-group changes |
| Authors of publication | Clemente, Dore Augusto; Marzotto, Armando |
| Journal of publication | Acta Crystallographica Section B |
| Year of publication | 2003 |
| Journal volume | 59 |
| Journal issue | 1 |
| Pages of publication | 43 - 50 |
| a | 11.361 ± 0.006 Å |
| b | 8.303 ± 0.005 Å |
| c | 8.987 ± 0.005 Å |
| α | 90° |
| β | 95.25 ± 0.05° |
| γ | 90° |
| Cell volume | 844.2 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | I 1 2/m 1 |
| Hall space group symbol | -I 2y |
| Residual factor for all reflections | 0.0116 |
| Residual factor for significantly intense reflections | 0.0102 |
| Weighted residual factors for significantly intense reflections | 0.0336 |
| Weighted residual factors for all reflections included in the refinement | 0.0647 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.423 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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