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Information card for entry 2104200
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| Coordinates | 2104200.cif |
|---|---|
| Structure factors | 2104200.hkl |
| Original IUCr paper | HTML |
| Formula | C9 H30 Cl9 P3 Sb2 |
|---|---|
| Calculated formula | C9 H30 Cl9 P3 Sb2 |
| SMILES | [Sb]([Cl][Sb](Cl)(Cl)(Cl)Cl)(Cl)(Cl)(Cl)Cl.[PH+](C)(C)C.[PH+](C)(C)C.[PH+](C)(C)C |
| Title of publication | From six- to five-coordinated Sb^III^ in [(CH~3~)~3~PH]~3~[Sb~2~Cl~9~]: transition pathways from single-crystal X-ray diffraction |
| Authors of publication | Gagor, Anna; Wojtaś, Maciej; Pietraszko, Adam; Jakubas, Ryszard |
| Journal of publication | Acta Crystallographica Section B |
| Year of publication | 2008 |
| Journal volume | 64 |
| Journal issue | 5 |
| Pages of publication | 558 - 566 |
| a | 14.842 ± 0.003 Å |
| b | 9.3475 ± 0.0019 Å |
| c | 21.624 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3000 ± 1 Å3 |
| Cell temperature | 175 ± 2 K |
| Ambient diffraction temperature | 175 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0641 |
| Residual factor for significantly intense reflections | 0.0257 |
| Weighted residual factors for significantly intense reflections | 0.0494 |
| Weighted residual factors for all reflections included in the refinement | 0.0605 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.942 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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