Crystallography Open Database

Information card for entry 2104228

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Coordinates	2104228.cif
Original IUCr paper	HTML

Structure parameters

Formula	Co2 O4 Si
Calculated formula	Co2 O4 Si
Title of publication	Structural behaviour of synthetic Co~2~SiO~4~ at low temperatures
Authors of publication	Sazonov, Andrew; Meven, Martin; Hutanu, Vladimir; Kaiser, Volker; Heger, Gernot; Trots, Dmytro; Merz, Michael
Journal of publication	Acta Crystallographica Section B
Year of publication	2008
Journal volume	64
Journal issue	6
Pages of publication	661 - 668
a	10.2864 ± 0.0001 Å
b	5.9872 ± 0.0001 Å
c	4.7785 ± 0.0001 Å
α	90°
β	90°
γ	90°
Cell volume	294.292 ± 0.008 Å³
Cell temperature	2.5 K
Ambient diffraction temperature	2.5 K
Number of distinct elements	3
Space group number	62
Hermann-Mauguin space group symbol	P n m a
Hall space group symbol	-P 2ac 2n
Residual factor for all reflections	0.0491
Residual factor for significantly intense reflections	0.033
Weighted residual factors for all reflections	0.0494
Weighted residual factors for significantly intense reflections	0.0444
Weighted residual factors for all reflections included in the refinement	0.0444
Goodness-of-fit parameter for all reflections	1.49
Goodness-of-fit parameter for significantly intense reflections	1
Goodness-of-fit parameter for all reflections included in the refinement	1
Diffraction radiation probe	neutron
Diffraction radiation wavelength	0.552 Å
Diffraction radiation type	constantwavelengthneutrondiffraction
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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