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Information card for entry 2200049
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| Coordinates | 2200049.cif |
|---|---|
| Structure factors | 2200049.hkl |
| Original IUCr paper | HTML |
| Common name | Bis[1,2-bis(diphenylphosphino)ethane-P,P'](dithioformato-S,S')technetium tris(benzene) solvate |
|---|---|
| Formula | C71 H67 P4 S2 Tc |
| Calculated formula | C71 H67 P4 S2 Tc |
| Title of publication | Bis[1,2-bis(diphenylphosphino)ethane-<i>P</i>,<i>P</i>'](dithioformato-<i>S</i>,<i>S</i>')technetium tris(benzene) solvate |
| Authors of publication | Bryan, Jeffrey C.; Burrell, Anthony K.; Kubas, Gregory J. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2001 |
| Journal volume | 57 |
| Journal issue | 1 |
| Pages of publication | m1 - m2 |
| a | 14.132 ± 0.004 Å |
| b | 14.738 ± 0.006 Å |
| c | 17.031 ± 0.004 Å |
| α | 65.79 ± 0.03° |
| β | 88.1 ± 0.03° |
| γ | 67.88 ± 0.03° |
| Cell volume | 2966 ± 2 Å3 |
| Cell temperature | 193 K |
| Ambient diffraction temperature | 193 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.066 |
| Residual factor for significantly intense reflections | 0.035 |
| Weighted residual factors for all reflections included in the refinement | 0.104 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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