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Information card for entry 2202474
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| Coordinates | 2202474.cif |
|---|---|
| Structure factors | 2202474.hkl |
| Original IUCr paper | HTML |
| Formula | C12 H26 N10 Ni2 |
|---|---|
| Calculated formula | C12 H26 N10 Ni2 |
| SMILES | C(#N)[Ni](C#N)(C#N)C#N.C1C[NH]2CC[NH2][Ni]342([NH2]CC[NH]4CC[NH2]3)[NH2]1 |
| Title of publication | Bis(diethylenetriamine)nickel(II) tetracyanonickelate(II) |
| Authors of publication | Muga, Iñaki; Vitoria, Pablo; Reinoso, Santiago; Gutiérrez-Zorrilla, Juan M. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2003 |
| Journal volume | 59 |
| Journal issue | 8 |
| Pages of publication | m576 - m578 |
| a | 15.138 ± 0.002 Å |
| b | 9.458 ± 0.001 Å |
| c | 15.248 ± 0.002 Å |
| α | 90° |
| β | 111.884 ± 0.016° |
| γ | 90° |
| Cell volume | 2025.8 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1278 |
| Residual factor for significantly intense reflections | 0.0422 |
| Weighted residual factors for significantly intense reflections | 0.064 |
| Weighted residual factors for all reflections included in the refinement | 0.0782 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.701 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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