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Information card for entry 2204548
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| Coordinates | 2204548.cif |
|---|---|
| Structure factors | 2204548.hkl |
| Original IUCr paper | HTML |
| Chemical name | Bis(O,O'-dicyclohexyl dithiophosphato-κ^2^S,S')platinum(II) |
|---|---|
| Formula | C24 H44 O4 P2 Pt S4 |
| Calculated formula | C24 H44 O4 P2 Pt S4 |
| SMILES | [Pt]12([S]=P(OC3CCCCC3)(OC3CCCCC3)S1)[S]=P(OC1CCCCC1)(OC1CCCCC1)S2 |
| Title of publication | Bis(<i>O,O</i>'-dicyclohexyl dithiophosphato-κ^2^<i>S,S</i>')platinum(II) |
| Authors of publication | Fong Sheen Kuan; Tiekink, Edward R. T. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2004 |
| Journal volume | 60 |
| Journal issue | 11 |
| Pages of publication | m1619 - m1620 |
| a | 11.876 ± 0.004 Å |
| b | 9.379 ± 0.003 Å |
| c | 13.889 ± 0.005 Å |
| α | 90° |
| β | 96.573 ± 0.007° |
| γ | 90° |
| Cell volume | 1536.9 ± 0.9 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.045 |
| Residual factor for significantly intense reflections | 0.034 |
| Weighted residual factors for significantly intense reflections | 0.079 |
| Weighted residual factors for all reflections included in the refinement | 0.085 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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