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Information card for entry 2206712
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| Coordinates | 2206712.cif |
|---|---|
| Structure factors | 2206712.hkl |
| Original IUCr paper | HTML |
| Common name | 1,2-Bis(2-aminophenoxy)ethane |
|---|---|
| Chemical name | 1,2-Bis(2-aminophenoxy)ethane |
| Formula | C14 H16 N2 O2 |
| Calculated formula | C14 H16 N2 O2 |
| SMILES | Nc1ccccc1OCCOc1ccccc1N |
| Title of publication | 1,2-Bis(2-aminophenoxy)ethane |
| Authors of publication | Rademeyer, Melanie; Barkhuizen, David A.; Kruger, Hendrik G.; Maguire, Glenn E. M. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2005 |
| Journal volume | 61 |
| Journal issue | 9 |
| Pages of publication | o3014 - o3016 |
| a | 26.33 ± 0.02 Å |
| b | 5.979 ± 0.008 Å |
| c | 8.163 ± 0.01 Å |
| α | 90° |
| β | 105.14 ± 0.1° |
| γ | 90° |
| Cell volume | 1240 ± 3 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0675 |
| Residual factor for significantly intense reflections | 0.0608 |
| Weighted residual factors for significantly intense reflections | 0.1658 |
| Weighted residual factors for all reflections included in the refinement | 0.1769 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.088 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
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