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Information card for entry 2244126
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| Coordinates | 2244126.cif |
|---|---|
| Structure factors | 2244126.hkl |
| Original IUCr paper | HTML |
| Common name | 4'-ethoxy-4-fluorochalcone |
|---|---|
| Chemical name | (2<i>E</i>)-1-(4-Ethoxyphenyl)-3-(4-fluorophenyl)prop-2-en-1-one |
| Formula | C17 H15 F O2 |
| Calculated formula | C17 H15 F O2 |
| SMILES | Fc1ccc(cc1)/C=C/C(=O)c1ccc(OCC)cc1 |
| Title of publication | Crystal structure of (2<i>E</i>)-1-(4-ethoxyphenyl)-3-(4-fluorophenyl)prop-2-en-1-one |
| Authors of publication | Bernhard, Merle; Lutter, Jacob C.; Predecki, Allison |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2022 |
| Journal volume | 78 |
| Journal issue | 8 |
| a | 7.1426 ± 0.0004 Å |
| b | 17.0566 ± 0.0009 Å |
| c | 11.152 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1358.63 ± 0.13 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P c a 21 |
| Hall space group symbol | P 2c -2ac |
| Residual factor for all reflections | 0.04 |
| Residual factor for significantly intense reflections | 0.039 |
| Weighted residual factors for significantly intense reflections | 0.1032 |
| Weighted residual factors for all reflections included in the refinement | 0.1042 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 276896 (current) | 2022-07-23 | cif/ hkl/ Adding structures of 2244126 via cif-deposit CGI script. |
2244126.cif 2244126.hkl |
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Users of the data should acknowledge the original authors of the
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