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Information card for entry 4116352
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| Coordinates | 4116352.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | clathrate_II_type |
|---|---|
| Formula | Cs Na2 Si17 |
| Calculated formula | Cs Na2 Si17 |
| Title of publication | Synthesis and Characterization of Stable Stoichiometric Clathrates of Silicon and Germanium: Cs8Na16Si136 and Cs8Na16Ge136 |
| Authors of publication | Svilen Bobev; Slavi C. Sevov |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1999 |
| Journal volume | 121 |
| Pages of publication | 3795 - 3796 |
| a | 14.756 ± 0.0004 Å |
| b | 14.756 ± 0.0004 Å |
| c | 14.756 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3212.96 ± 0.15 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 227 |
| Hermann-Mauguin space group symbol | F d -3 m :2 |
| Hall space group symbol | -F 4vw 2vw 3 |
| Residual factor for all reflections | 0.0231 |
| Residual factor for significantly intense reflections | 0.0201 |
| Weighted residual factors for all reflections | 0.0462 |
| Weighted residual factors for significantly intense reflections | 0.0453 |
| Goodness-of-fit parameter for all reflections | 1.203 |
| Goodness-of-fit parameter for significantly intense reflections | 1.235 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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