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Information card for entry 4116440
Preview
| Coordinates | 4116440.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H92 I2 P2 Ru S |
|---|---|
| Calculated formula | C52 H92 P2 Ru Si2 |
| Title of publication | Ruthenium Complexes Containing Two Ru-(η2-Si-H) Bonds: Synthesis, Spectroscopic Properties, Structural Data, Theoretical Calculations, and Reactivity Studies |
| Authors of publication | Fabien Delpech; Sylviane Sabo-Etienne; Jean-Claude Daran; Bruno Chaudret; Khansaa Hussein; Colin J. Marsden; Jean-Claude Barthelat |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1999 |
| Journal volume | 121 |
| Pages of publication | 6668 - 6682 |
| a | 20.8935 ± 0.0018 Å |
| b | 19.52 ± 0.0018 Å |
| c | 25.113 ± 0.002 Å |
| α | 90° |
| β | 90.331 ± 0.009° |
| γ | 90° |
| Cell volume | 10241.9 ± 1.5 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | I 1 2/a 1 |
| Hall space group symbol | -I 2ya |
| Residual factor for significantly intense reflections | 0.0257 |
| Weighted residual factors for significantly intense reflections | 0.0313 |
| Goodness-of-fit parameter for significantly intense reflections | 0.9675 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.