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Information card for entry 4308261
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| Coordinates | 4308261.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | ReO(OMe)(PhCONCSNEt2)2 |
|---|---|
| Chemical name | Bis(N-benzoyl-N',N'-diethylthioureato-O,S)methoxooxorhenium(V) |
| Formula | C25 H33 Cl0 N4 O4 P0 Re S2 |
| Calculated formula | C25 H33 N4 O4 Re S2 |
| Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
| Authors of publication | Nguyen Hung Huy; Ulrich Abram |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Pages of publication | 5310 - 5319 |
| a | 31.573 ± 0.002 Å |
| b | 11.338 ± 0.001 Å |
| c | 16.041 ± 0.001 Å |
| α | 90° |
| β | 109.85 ± 0.01° |
| γ | 90° |
| Cell volume | 5401.1 ± 0.8 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0654 |
| Residual factor for significantly intense reflections | 0.0387 |
| Weighted residual factors for significantly intense reflections | 0.073 |
| Weighted residual factors for all reflections included in the refinement | 0.0786 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.95 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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