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Information card for entry 4308264
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| Coordinates | 4308264.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Tc(PhCONCSNPh2)3 |
|---|---|
| Chemical name | Tris(N-benzoyl-N',N'-diphenylthioureato_O,S)technetium(III) x MeOH |
| Formula | C61 H49 Cl0 N6 O4 S3 Tc |
| Calculated formula | C61 H49 N6 O4 S3 Tc |
| Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
| Authors of publication | Nguyen Hung Huy; Ulrich Abram |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Pages of publication | 5310 - 5319 |
| a | 12.999 ± 0.001 Å |
| b | 13.635 ± 0.001 Å |
| c | 16.615 ± 0.002 Å |
| α | 93.08 ± 0.01° |
| β | 106.8 ± 0.01° |
| γ | 95.57 ± 0.01° |
| Cell volume | 2795.5 ± 0.5 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1291 |
| Residual factor for significantly intense reflections | 0.0588 |
| Weighted residual factors for significantly intense reflections | 0.1335 |
| Weighted residual factors for all reflections included in the refinement | 0.1697 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.888 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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