Crystallography Open Database

Information card for entry 4308702

Preview

Coordinates	4308702.cif
Original paper (by DOI)	HTML

Structure parameters

Common name	(19) [Dy(m-OSiPh3)(OSiPh3)2]2
Formula	C115 H98 Dy2 O6 Si6
Calculated formula	C108 H90 Dy2 O6 Si6
SMILES	[Dy]1([O]([Si](c2ccccc2)(c2ccccc2)c2ccccc2)[Dy]([O]1[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)O[Si](c1ccccc1)(c1ccccc1)c1ccccc1
Title of publication	Synthesis and Characterization of a Family of Structurally Characterized Dysprosium Alkoxides for Improved Fatigue-Resistance Characteristics of PDyZT Thin Films
Authors of publication	Timothy J. Boyle; Scott D. Bunge; Paul G. Clem; Jacob Richardson; Jeffrey T. Dawley; Leigh Anna M. Ottley; Mark A. Rodriguez; Bruce A. Tuttle; Gabriel R. Avilucea; Ralph G. Tissot
Journal of publication	Inorganic Chemistry
Year of publication	2005
Journal volume	44
Pages of publication	1588 - 1600
a	14.2341 ± 0.0015 Å
b	15.4455 ± 0.0016 Å
c	22.348 ± 0.002 Å
α	90°
β	91.675 ± 0.002°
γ	90°
Cell volume	4911.2 ± 0.8 Å³
Cell temperature	168 ± 2 K
Ambient diffraction temperature	168 ± 2 K
Number of distinct elements	5
Space group number	14
Hermann-Mauguin space group symbol	P 1 21/n 1
Hall space group symbol	-P 2yn
Residual factor for all reflections	0.0713
Residual factor for significantly intense reflections	0.0486
Weighted residual factors for significantly intense reflections	0.0895
Weighted residual factors for all reflections included in the refinement	0.0955
Goodness-of-fit parameter for all reflections included in the refinement	1.058
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

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