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Information card for entry 7112252
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| Coordinates | Coordinates are not available: file is not found. |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H47 P Si4 |
|---|---|
| Calculated formula | C24 H47 P Si4 |
| SMILES | [Si]12([Si](P([Si]1(C(C)C)C(C)C)[Si]2(C(C)C)C(C)C)(C(C)C)C(C)C)c1ccccc1 |
| Title of publication | Branched tetrasilane substituted phosphines – synthesis and characterisation of PhSi(SiiPr2)3P and {PhSi(SiMe2)3}2P14 |
| Authors of publication | Michael Feierabend; Carsten von Hanisch |
| Journal of publication | Chem.Commun. |
| Year of publication | 2014 |
| Journal volume | 50 |
| Pages of publication | 4416 |
| a | 9.164 ± 0.003 Å |
| b | 10.207 ± 0.003 Å |
| c | 16.441 ± 0.009 Å |
| α | 92.88 ± 0.04° |
| β | 94.84 ± 0.04° |
| γ | 110.34 ± 0.02° |
| Cell volume | 1431.6 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0289 |
| Residual factor for significantly intense reflections | 0.0247 |
| Weighted residual factors for significantly intense reflections | 0.0657 |
| Weighted residual factors for all reflections included in the refinement | 0.0673 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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