Crystallography Open Database

Information card for entry 8000112

Preview

Coordinates	8000112.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C20 H60 Cl4 Co2 N9 Na O22 Pt2 S5
Calculated formula	C20 H60 Cl4 Co2 N9 Na1.00333 O22 Pt2 S5
SMILES	C1([C@@H]2C(=O)O[Co]345([NH2]2)[S]1[Pt]([NH2]C)([NH2]C)[S]1CC[NH2][Co]261([NH2]CC[S]2[Pt]([NH2]C)([NH2]C)[S]5C([C@H](C(=O)O4)[NH2]3)(C)C)[NH2]CCS6)(C)C.O.O=Cl(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].O.O=Cl(=O)(=O)[O-].[Na+].Cl(=O)(=O)(=O)[O-]
Title of publication	Anion-controlled Preparation of Chiral S-Bridged CoIIIPtII2 and CoIII2PtII2 Complexes Consisting of [Co(D-penicillaminato-N,O,S)2]− and [Pt(CH3NH2)2]2+ Units
Authors of publication	Igashira-Kamiyama, Asako; Fujioka, Junji; Kodama, Tomoki; Kawamoto, Tatsuya; Konno, Takumi
Journal of publication	Chemistry Letters
Year of publication	2006
Journal volume	35
Journal issue	5
Pages of publication	522
a	19.879 ± 0.005 Å
b	19.879 ± 0.005 Å
c	22.926 ± 0.012 Å
α	90°
β	90°
γ	120°
Cell volume	7846 ± 5 Å³
Cell temperature	296 ± 2 K
Ambient diffraction temperature	296 ± 2 K
Number of distinct elements	9
Space group number	173
Hermann-Mauguin space group symbol	P 63
Hall space group symbol	P 6c
Residual factor for all reflections	0.2822
Residual factor for significantly intense reflections	0.0631
Weighted residual factors for significantly intense reflections	0.1309
Weighted residual factors for all reflections included in the refinement	0.1875
Goodness-of-fit parameter for all reflections included in the refinement	0.933
Diffraction radiation wavelength	0.71069 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

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