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Information card for entry 2011644
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| Coordinates | 2011644.cif |
|---|---|
| Original IUCr paper | HTML |
| Common name | none |
|---|---|
| Chemical name | tetracis(diethyldithiocarbamato)tellurium(IV) |
| Formula | C20 H40 N4 S8 Te |
| Calculated formula | C20 H40 N4 S8 Te |
| SMILES | C1(=[S][Te]234(S1)([S]=C(N(CC)CC)S2)([S]=C(N(CC)CC)S3)[S]=C(N(CC)CC)S4)N(CC)CC |
| Title of publication | Tetragonal polymorphic modification of tetrakis(<i>N</i>,<i>N</i>-diethyldithiocarbamato-<i>S</i>,<i>S</i>')tellurium(IV) |
| Authors of publication | Virovets, Alexander V.; Kalinina, Irina V.; Fedin, Vladimir P.; Fenske, Dieter |
| Journal of publication | Acta Crystallographica Section C |
| Year of publication | 2000 |
| Journal volume | 56 |
| Journal issue | 12 |
| Pages of publication | e589 - e590 |
| a | 10.397 ± 0.0015 Å |
| b | 10.397 ± 0.0015 Å |
| c | 29.262 ± 0.006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3163.2 ± 0.9 Å3 |
| Cell temperature | 212 ± 2 K |
| Ambient diffraction temperature | 212 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 96 |
| Hermann-Mauguin space group symbol | P 43 21 2 |
| Hall space group symbol | P 4nw 2abw |
| Residual factor for all reflections | 0.04 |
| Residual factor for significantly intense reflections | 0.029 |
| Weighted residual factors for all reflections included in the refinement | 0.057 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.125 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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