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Information card for entry 4075602
Preview
| Coordinates | 4075602.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H67 Cl O2 Os P2 Sn |
|---|---|
| Calculated formula | C44 H59 Cl O2 Os P2 Sn |
| SMILES | [OsH2]1([Sn]([O]=C(O1)c1ccccc1)(c1ccccc1)c1ccccc1)([P](C(C)C)(C(C)C)C(C)C)([P](C(C)C)(C(C)C)C(C)C)Cl.Cc1ccccc1 |
| Title of publication | Preparation, X-ray Structures, and NMR Spectra of Elongated Dihydrogen Complexes with Four- and Five-Coordinate Tin Centers |
| Authors of publication | Eguillor, Beatriz; Esteruelas, Miguel A.; Oliván, Montserrat |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 19 |
| Pages of publication | 4691 |
| a | 10.7119 ± 0.0014 Å |
| b | 14.3315 ± 0.0019 Å |
| c | 29.82 ± 0.004 Å |
| α | 90° |
| β | 93.256 ± 0.003° |
| γ | 90° |
| Cell volume | 4570.5 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1151 |
| Residual factor for significantly intense reflections | 0.0412 |
| Weighted residual factors for significantly intense reflections | 0.0807 |
| Weighted residual factors for all reflections included in the refinement | 0.1074 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.789 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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