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Information card for entry 4075603
Preview
| Coordinates | 4075603.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H59 Cl O4 Os P2 Sn |
|---|---|
| Calculated formula | C38 H59 Cl O4 Os P2 Sn |
| SMILES | [OsH2]1([Sn]2([O]=C(O1)c1ccccc1)([O]=C(O2)c1ccccc1)c1ccccc1)(Cl)([P](C(C)C)(C(C)C)C(C)C)[P](C(C)C)(C(C)C)C(C)C |
| Title of publication | Preparation, X-ray Structures, and NMR Spectra of Elongated Dihydrogen Complexes with Four- and Five-Coordinate Tin Centers |
| Authors of publication | Eguillor, Beatriz; Esteruelas, Miguel A.; Oliván, Montserrat |
| Journal of publication | Organometallics |
| Year of publication | 2006 |
| Journal volume | 25 |
| Journal issue | 19 |
| Pages of publication | 4691 |
| a | 11.6836 ± 0.0005 Å |
| b | 15.6616 ± 0.0007 Å |
| c | 21.8655 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4001 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0399 |
| Residual factor for significantly intense reflections | 0.0342 |
| Weighted residual factors for significantly intense reflections | 0.0512 |
| Weighted residual factors for all reflections included in the refinement | 0.0526 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.909 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
Version history
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