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Information card for entry 8101685
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| Coordinates | 8101685.cif |
|---|
| Chemical name | bis(triphenylphosphine)hexakis(phenylselenido)tetramercury(II) |
|---|---|
| Formula | C84 H70 Hg4 P2 Se8 |
| Calculated formula | C84 H70 Hg4 P2 Se8 |
| Title of publication | Crystal structure of bis(triphenylphosphine)hexakis(μ-phenylselenido) bis(phenylselenido)tetramercury(II), Hg~4~[P(C~6~H~5~)~3~]~2~(C~6~H~5~Se) ~8~ |
| Authors of publication | R.-F. Wang; W.-G. Zhang; J. Fan; S.-L. Wang |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2005 |
| Journal volume | 220 |
| Journal issue | 1 |
| Pages of publication | 61 - 64 |
| a | 13.7322 ± 0.0011 Å |
| b | 14.7879 ± 0.0012 Å |
| c | 22.6406 ± 0.0018 Å |
| α | 73.095 ± 0.002° |
| β | 73.579 ± 0.002° |
| γ | 65.783 ± 0.001° |
| Cell volume | 3940.9 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0451 |
| Residual factor for significantly intense reflections | 0.0319 |
| Weighted residual factors for significantly intense reflections | 0.0651 |
| Weighted residual factors for all reflections included in the refinement | 0.0707 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.937 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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