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Information card for entry 8101686
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| Coordinates | 8101686.cif |
|---|
| Chemical name | tetrakis(4-methylbenzoato)bis[(μ-4-methylbenzoato-O,O')(1,10-phenanthroline)] diholmium(III) |
|---|---|
| Formula | C72 H58 Ho2 N4 O12 |
| Calculated formula | C72 H58 Ho2 N4 O12 |
| Title of publication | Crystal structure of bis(1,10-phenanthroline)tetrakis(4-methylbenzoato) bis(μ-4-methylbenzoato-O,O')diholmium(III), Ho~2~(C~8~H~7~O~2~)~6~(C~12~H~8~N~2~)~2~ |
| Authors of publication | X. Li; Y.-Q. Zou |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2005 |
| Journal volume | 220 |
| Journal issue | 1 |
| Pages of publication | 33 - 35 |
| a | 10.659 ± 0.003 Å |
| b | 12.29 ± 0.004 Å |
| c | 13.93 ± 0.004 Å |
| α | 70.253 ± 0.005° |
| β | 82.368 ± 0.005° |
| γ | 68.698 ± 0.004° |
| Cell volume | 1600.1 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0392 |
| Residual factor for significantly intense reflections | 0.0274 |
| Weighted residual factors for significantly intense reflections | 0.0596 |
| Weighted residual factors for all reflections included in the refinement | 0.0645 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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